This document addresses commonly asked questions about Ball Grid Arrays(BGAs). Also addressed are Manufacturing, Testing and Assembly issues specific to BGAs. A list of Contract Manufacturing Vendors capable of handling BGAs is provided. Also provided is a bibliography of articles which provide a good overview of BGA technology.
BGA Technology
Q: Why has BGA technology come to the forefront all of a sudden?
A: Due to fundamental limitations of wirebonding technology and pad pitch, PQFP/TQFP package option has run into a roadblock at pin count of 256 and above. The issue is that maximum wire lengths for currently available equipment is approximately 220-240 mils before significant yield loss occurs. Also, current standard leadframe stamping technology allows a best case lead frame finger pitch of 8.5 mils. To go below this finger pitch on lead frames is possible, but cost ineffective.
Q: If BGAs are so wonderful, why wasnt their use prevalent until recently?
A: Until 1993, the only BGA assembly was in captive assembly houses. With JEDEC registration in 1992 and licensing of the OMPAC process by Citizen, AMKOR, and others, the technology is catching on. As reliability data, advantages of the attachment process to printed circuit board, and the benefits of the space savings for system users become more evident, BGA packaging will catch on.
Q: How does a cross-sectional view of a BGA look?
A: Figure attached.
BGA Sectional View
Q: What is Ball Grid Array?
A: Plastic Ball Grid Array (PBGA) packages have increased signal density per unit area dramatically as compared to standard Quad-flat packs (QFP s). A high pin count array creates problems associated with routing signal traces out from the ball grid array device. The Perimeter Ball Grid Array improves the ability to route signals from the device, by depopulating the center balls and decreasing the pitch slightly.
Q: With regards to manufacturing, what does BGA buy me?
A: Improved Manufacturability:
· Relaxed lead pitch: 1.27mm compared to 0.4mm for a 208-pin PQFP.
· Coplanar issues absent, no lead skew concerns.
· Significantly improved manufacturing yields.
Reduced Size:
· Smaller footprint.
· PC board savings.
Improved Electrical & Thermal Performance:
· Excellent platform for enhanced thermal and electrical properties compared to PQFP.
Q: Can damaged balls be fixed or replaced?
A: Yes, BGA technology allows for damaged balls to be fixed and/or replaced. The rework involves removal of solder from the pad surface, then replacing with a new component using only liquid flux on the pad and allowing the ball on the new device to form t he interconnection.
Q: How many times can the package be desoldered before degrading the balls?
A: Typically, it can be done once.
Q: What should one look for during BGA assembly?
A: No device tweaking should be carried out after placement. Also, slightly misaligned parts will automatically align correctly during reflow. Grossly misaligned devices should be removed prior to reflow as they will have shorts if they are subjected to re flows.
Q: What are the most commonly used techniques in BGA rework/repair?
A: With QFPs, rework and inspection becomes more difficult as the pitch gets finer, hence newer techniques are needed. The technology and process knowledge to effectively and efficiently repair BGA s already exists. An added attraction for BGA packages is that they are compatible with existing SMT assembly processes and equipment: existing solder paste screen, pick-and-place reflow equipment can be used. Generally speaking, the percentage of non-repairable defects is significantly lower in BGA s compared to QFPs. There are two main approaches to BGA repair:
· Conductive heating: heat BGA & PCB to reflow solder balls.
· Convective heating: heat solder balls while minimizing heating of PCB and BGA.
Q: Are there any package performance comparisons between a PGA, BGA and a QFP?
A: Please refer to the table provided:
Various Factors | PGA | QFP | BGA |
Size | 43.5x43.5 mm | 26x26 mm | 21 x 21 mm |
I/Os | 196 | 256 | 324 |
I/O classification | Pins | Leads | Pads |
Signal-Signal Capacitance | 1.43 pF | - | 0.40 pF |
Signal-Gnd Capacitance | 6.67 pF | 1.78 pF | 1.85 pF |
Mutual Inductance | 8.57 nF | 20.31 nF | 3.26 nF |
Ground Inductance | - | - | 0.76 nH |
Contractor | Contact | Design Layout | Circuit Analysis | Thermal Analysis | BGA | Quality Systems |
Anam/Amkor | Gil Olachea 602-821-5000 | Yes | Yes | Yes | Yes | ISO 9002 |
SCI Systems | Larry Evans George King 205-882-4631 | Yes | Yes | Yes | Yes | ISO 9002 |
Solectron | Gary Ogden 408-956-6689 Srinivas Rao 408-956-6478 | Yes | No | No | Yes | ISO 9000 |
Valtronic USA | Joy Shanklin 216-349-1239 | Yes | No | No | Yes | ISO 9000 |
S-MOS Systems | Pam Preston 408-922-0578 | Yes | Yes | Yes | Yes | ISO 9002 |
Group Technologies | Brian Tracey 813-972-6242 Scott Mauldin 813-972-6134 Frank Mendoza 813-972-6941 | Yes | Yes | No | No |
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