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Z1890

Teradyne, Inc.


Architecture:
Type :
Last Update:

FLASH Bulk-Erase_Component
Automatic Test Equipment/On-Board Programming
8/14/96 2:19:00 PM

Vendor Information



Tool Description:

The Z1890 is the industry's leader in cost efficiency, fast programming time, fast cycle time, and reliability. The Z1890 test system provides complete analog and digital power-on in-circuit testing for manufacturing defects. The Z1890 also provides a practical, cost effective means to add product function test (PFT) in a single manufacturing process step.
Standard MultiScan vectorless test finds manufacturing faults on even the largest VLSI and custom devices with almost no programming effort and no test vectors. Product function test allows you to combine IEEE, VXI and custom instrumentation. Programming is accomplished via graphical worksheet style interfaces. The integrated National Instruments' LabWindows* environment features virtual instrument user interfaces with hundreds of available instrument drivers.
Functional interface board (FIB) on Z1800-Series route high-bandwidth signals to the main switch matrix. The FIB also incorporates high current switching and custom "breadboard" circuit modules.
Automatic test generation and validation tools increase test generation and production testing yields.
Comprehensive analog, digital, and synchronous mixed-signal test capability allow for testing of the most complex boards being built today.
The available Digital Function Processor (DFP) delivers comprehensive digital functional stimulus/measurement for Intel Flash memory, PLD and other memory testing and programming. The Z1800-Series is available in various system configurations, pre-wired for 1024 to 5120 analog/digital pins. Board-under-test power supplies include 5V, and two 0-55V (programmable). The system is equipped with system self test and diagnostics.
Designed with minimum footprint, ergonomic console, and available board handlers, the Z1800-Series integrates easily with automated SMT assembly lines.
The Z1800-Series uses the 80486/66MHz PC (or faster) system controller (not included) and DOS & Windows*-compatible software. Real-time ProcessWatch* software monitors the assembly process and provides alarms and charts.

Tool Features:

  • Cost-effective in-circuit test targets manufacturing defects

  • Product function test and in-circuit process test combined in one platform

  • Open architecture and built-in upgrade path

  • Flexibility and high throughput

  • Digital function testing and programming of flash memory, PLD and other memory devices

  • Reduces manufacturing process steps, costs, and cycle times
  • File Attachments:

    SOLF_082.PDF - SolutionsFlash Memory Catalog Product Listing

    Supported Device Detail Matrix:

    Part & Package

    Availability

    28F010 - Plastic Dip-32 ld
    28F010 - PLCC-32 ld
    28F010 - TSOP-32 ld
    28F010 - TSOP-32 ld(R)
    28F020 - Plastic Dip-32 ld
    28F020 - PLCC-32 ld
    28F020 - TSOP-32 ld
    28F020 - TSOP-32 ld(R)

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    Vendor Information:


    Teradyne, Inc.

    2625 Shadelands Drive
    Walnut Creek , CA 94598
    USA
    (510) 932-6900

    Email : teranet@teradyne.com
    Fax : (510) 934-0540
    URL : http://www.teradyne.com

    Contact the vendor above for the latest Distributor information




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